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TEST

LabVIEW updates meet development challenges

Tuesday 25 August 2009

National Instruments has released LabVIEW 2009, the latest version of its graphical system design software platform for test, control and embedded system development.


Data bus test software

Wednesday 10 June 2009

Ballard’s CoPilot (distributed by Dedicated Systems in Australia) is data bus test, simulation and analysis software.


Superspeed USB Test Solution

Thursday 04 June 2009

Tektronix (distributed in Australia TekMark) has announced a toolset for characterisation, debug and automated compliance test of Superspeed USB (USB 3.0) devices.


Test system for WirelessHD modules

Wednesday 13 May 2009

Agilent Technologies has introduced a WirelessHD compliance tester - the CTS-1000 automated WirelessHD test system - designed specifically for manufacturers of WirelessHD modules and chipsets for consumer and computing products.


Test Mobile adds LTE Support

Tuesday 05 May 2009

Aeroflex (distributed in Australia by Vicom) has announced the addition of UE CAT3 and UE CAT4 support to its TM500 LTE Test Mobile.


LabVIEW Toolkits

Wednesday 18 March 2009

National Instruments has announced the NI LabVIEW Unit Test Framework and LabVIEW Desktop Execution Trace toolkits, which are software engineering tools for the LabVIEW graphical development environment.


PAT tester

Tuesday 03 March 2009

The Seaward PAT tester (distributed in Australia by RS Components) is a lightweight battery powered handheld tester incorporating all Class I and Class II required electrical safety tests.


Connector passes ‘rugged’ test

Monday 23 February 2009

Harting (distributed in Australia by Soanar) has released the MicroTCATM connector.


Tektronix named two-time finalist for 'Best in Test' 2009 Awards

Monday 19 January 2009

Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, today announced that two of its products were selected by the editors of Test & Measurement World magazine for its Best in Test 2009 industry awards.


Tektronix named 'Test of Time' finalist

Monday 19 January 2009

Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, today announced the Tektronix TDS3000 oscilloscope has been selected by editors of Test & Measurement World magazine as a 2009 Test of Time award finalist.


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Semiconductor growth in 2010 Will the semiconductor industry enjoy a resurgence of Earth-shattering magnitude in 2010?
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