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USB

Universal USB charging

Wednesday 26 November 2008

Summit Microelectronics (distributed in Australia by Allyanz) has introduced its third-generation programmable battery charger integrated circuit (IC) for single-cell Li-Ion and Li-polymer powered systems.


USB security dongle

Thursday 25 September 2008

Future Technology Devices International (FTDI), available through GLYN High-Tech Distribution, recently announced the availability of its USB-Key security device.


Cyan USB/Ethernet-Solved development kit

Wednesday 17 September 2008

Cyan, available through GLYN High-Tech Distribution, has introduced the USB / Ethernet-Solved development kit which allows projects based around USB and Ethernet to be created quickly and easily.


PIC32 family grows

Thursday 17 April 2008

Microchip Technology has released a PIC32 product with integrated USB 2.0 On-The-Go (OTG) functionality.


Pro audio interface

Tuesday 15 April 2008

ARX has released the USB-DI Digital to Analogue Direct Box.


USB digital multimeter

Wednesday 09 April 2008

Signametrics has released the SMU2055 USB digital multimeter. At 227g and with dimensions of 12.7 x 12.7 x 3.3cm, it offers a 90% reduction in size and power from bench-top DMMs.


Interfacing a USB flash drive to a PIC microcontroller

Monday 03 December 2007

Fred Dart, from Future Technology Devices International (FTDI),describes how to easily link a USB flash drive to a simple, low cost microcontroller in an embedded design


Analyser

Wednesday 28 November 2007

Ellisys announced the new multifunction USB Explorer 260 protocol test system. This new Ellisys product is able to analyse any USB 1.1 or USB 2.0 link, including OTG and IC-USB; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing; and, verify the


Analyser

Wednesday 14 November 2007

Ellisys announced the new multifunction USB Explorer 260 protocol test system. This new Ellisys product is able to analyse any USB 1.1 or USB 2.0 link, including OTG and IC-USB; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing; and, verify the


USB data acquisition devices

Tuesday 09 October 2007

National Instrument’s line of data acquisition devices now addresses high-channel-count, portable and benchtop applications


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